The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
May. 27, 2015
Applicant:
Apple Inc., Cupertino, CA (US);
Inventors:
Amir Nahir, Haifa, IL;
Randal S. Thelen, Cupertino, CA (US);
Yair Dagan, Haifa, IL;
Yuval Gonczarowski, Haifa, IL;
Assignee:
APPLE INC., Cupertino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0736 (2013.01); G06F 11/0751 (2013.01); G06F 11/263 (2013.01);
Abstract
A method includes holding a definition of multiple software-implemented tests for testing one or more hardware units of an Integrated Circuit (IC), and of invocation conditions that specify whether the tests are permitted to run. The tests are applied to the hardware units at least partially in parallel, using a processor in the IC, by repeatedly tracking respective execution states of the tests and evaluating the invocation conditions, and invoking a test that currently does not run but is permitted to run in accordance with the invocation conditions.