Boston, MA, United States of America

Ran Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Metalenz, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ran Zhang. Retrieved from https://idiyas.com/inventor/ran-zhang-p33lgu4n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ran Zhang: Inventor of a Metasurface Optical Module

Introduction

Ran Zhang is an inventor based in Boston, Massachusetts, whose work includes an optical module designed to make metasurface technology more economical to integrate and manufacture. He is associated with Metalenz, Inc., a company working in the field of metasurface optics.

Latest Patents

Zhang is named on one patent: Optical Module Including Metasurface Chip and Methods of Manufacturing Thereof. The patent describes a metasurface module with a chip mounted on a secondary substrate. The substrate extends beyond every side of the chip, fully surrounding it, and can be used to mount the chip inside a housing. This arrangement may allow the metasurface chip to be smaller, helping reduce manufacturing costs and simplify integration.

Career Highlights

Zhang’s patent reflects an engineering approach to reducing the cost of incorporating metasurface elements into optical modules. The disclosed design uses the secondary substrate as a mounting interface between the metasurface chip and its housing. Zhang’s reported patent portfolio includes 1 patent.

Collaborations

Zhang’s listed coworker is Carlos Calvo. Their association connects Zhang’s work with the broader team at Metalenz, Inc.

Conclusion

Ran Zhang’s patented optical-module design addresses practical challenges in integrating metasurface chips, with a substrate-based mounting approach intended to reduce chip size and manufacturing costs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…