Rameswar Panda

Title: Rameswar Panda: Innovator in Image Processing Technologies

Introduction

Rameswar Panda is a notable inventor based in Riverside, CA (US). He has made significant contributions to the field of image processing, particularly in the areas of anomaly detection and defect identification. With a total of 3 patents, his work showcases innovative methods that enhance the accuracy and efficiency of image analysis.

Latest Patents

Rameswar Panda's latest patents include groundbreaking technologies. One of his patents focuses on "Weakly supervised anomaly detection and segmentation in images." This invention discloses systems and methods for processing images to detect anomalous pixels. The process involves receiving an image classification from a trained convolutional neural network (CNN) and generating attention mappings to create positive and negative masks for segmented anomalous pixels.

Another significant patent is the "Method and system for detecting defects on the surface of an object." This invention presents a method where an imaging device captures images of an object's surface under various illumination conditions. The images undergo multiple processing operations to identify potential defects based on predictable patterns of brightness and shadow. The method allows for efficient automated detection of micro defects, enhancing quality control in manufacturing processes.

Career Highlights

Throughout his career, Rameswar Panda has worked with prominent companies such as Siemens Energy, Inc. and Siemens Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in image processing technologies.

Collaborations

Rameswar has collaborated with talented individuals in his field, including Ziyan Wu and Jan Ernst. These collaborations have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Rameswar Panda is a distinguished inventor whose work in image processing has led to significant advancements in anomaly detection and defect identification. His innovative patents reflect his expertise and commitment to improving technology in this field.