Siemens Energy, Inc.

Siemens Corporation

Rameswar Panda

Ziyan Wu

Jan Ernst

Kevin P Bailey

Ti-chiun Chang

Arun Innanje

Ramesh Nair

Systems and methods are disclosed for processing an image to detect anomalous pixels. An image classification is received from a trained convolutional neural network (CNN) for an input image with a positive classification being defined to represent detection of an anomaly in the image and a negative classification being defined to represent absence of an anomaly. A backward propagation analysis of the input image for each layer of the CNN generates an attention mapping that includes a positive attention map and a negative attention map. A positive mask is generated based on intensity thresholds of the positive attention map and a negative mask is generated based on intensity thresholds of the negative attention map. An image of segmented anomalous pixels is generated based on an aggregation of the positive mask and the negative mask.

Weakly supervised anomaly detection and segmentation in images

Method and system for detecting defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect area of potential defect at location on surface of object based on predictable pattern consisting of bright and shadow regions. Kernels are defined corresponding to configurations of dark field illumination sources to enhance detecting potential defect. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypothesis of potential defect at location on surface of object. The hypothesis is classified with a classifier to determine whether the potential defect is true defect. The classifier is trained with training data having characteristics of true defect. The method provides efficient automated detection of micro defects on surface of object.

Method and system for detecting defects on surface of object

Method and system for detecting line defects on surface of object are presented. An imaging device captures images of surface of object under ambient and dark field illumination conditions. The images are processed with a plurality of image operations to detect areas of potential defects based on predictable pattern consisting of bright and shadow regions. Areas of potential defect are cut from processed images to sub images. Sub images are stitched together to generate hypotheses of potential defects at locations on surface of object. The hypotheses are classified to determine whether the potential defects are true defects at the locations. Line defect is detected by refining line segments detected on the processed image based on criteria. The criteria include distance from the true defects to the line segments and slops between the true defects and the line segments are less than threshold values.

Method and system for detecting line defects on surface of object

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Riverside, CA, United States of America

Rameswar Panda