Ram Peltinov

Title: Ram Peltinov: Innovator in High Electron Energy Measurement Technologies

Introduction

Ram Peltinov is a notable inventor based in Tel Aviv, Israel. He has made significant contributions to the field of measurement technologies, particularly through his innovative patent related to high electron energy. His work is instrumental in advancing the methods used for overlay error measurement in complex layered structures.

Latest Patents

Peltinov holds a patent for "High electron energy based overlay error measurement methods and systems." This patent describes a method, system, and computer-readable medium that involves obtaining first area information representative of a first area of a first layer of an inspected object. The method includes directing electrons of a primary electron beam to interact with both the first and second areas of the object, generating detection signals, and determining spatial relationships between features of the layers based on these signals.

Career Highlights

Ram Peltinov is currently employed at Applied Materials Israel Limited, where he continues to develop and refine technologies that enhance measurement accuracy in semiconductor manufacturing. His expertise in electron beam interactions has positioned him as a key player in the industry.

Collaborations

Peltinov collaborates with talented professionals such as Moshe Langer and Ofer Adan. Their combined efforts contribute to the innovative environment at Applied Materials Israel Limited, fostering advancements in measurement technologies.

Conclusion

Ram Peltinov's contributions to high electron energy measurement methods exemplify the innovative spirit of modern inventors. His work not only enhances the accuracy of measurements in layered structures but also reflects the ongoing evolution of technology in the semiconductor industry.