Ferguson, MO, United States of America

Ralph M Chambers, Jr


Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 57(Granted Patents)


Company Filing History:


Years Active: 1976-1978

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2 patents (USPTO):Explore Patents

Title: Ralph M Chambers, Jr: Innovator in Electronic Image Analysis

Introduction

Ralph M Chambers, Jr. is a notable inventor based in Ferguson, MO (US), recognized for his contributions to electronic image analysis. He holds 2 patents that showcase his innovative approach to inspecting transparent objects and containers.

Latest Patents

One of his latest patents is an electronic image analyzing method and apparatus. This invention is designed to inspect transparent objects by producing an illuminated image on a photoelectronic sensor, which is then scanned electronically. The system utilizes an electronic look window that matches the shape of a standard object contour, allowing for precise inspections. Additionally, the analyzer can compare the physical characteristics of various objects, rejecting those that do not conform to the stored standard contour information.

Another significant patent is the container inspection apparatus and method of inspection. This invention focuses on inspecting transparent containers used for food and beverages. It illuminates each container from different angles and processes the images to detect dirt, foreign objects, and manufacturing defects. The system is equipped with a reject mechanism that activates when a change in illumination level is detected within a specified electronic window.

Career Highlights

Ralph M Chambers, Jr. is currently associated with Barry-Wehmiller Company, where he continues to apply his expertise in electronic image analysis. His work has significantly impacted the quality control processes in various industries.

Collaborations

Throughout his career, Chambers has collaborated with talented individuals such as Siamac Faani and Jack R Obst, contributing to the advancement of technology in his field.

Conclusion

Ralph M Chambers, Jr. stands out as an innovative inventor whose work in electronic image analysis has led to significant advancements in inspection technology. His patents reflect a commitment to improving quality control in various applications, making him a valuable contributor to the field.

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