The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 1978
Filed:
Dec. 01, 1975
Siamac Faani, Ferguson, MO (US);
Ralph M Chambers, Jr, Ferguson, MO (US);
Jack R Obst, Florissant, MO (US);
Robert L Klamm, St. Charles, MO (US);
Barry-Wehmiller Company, St. Louis, MO (US);
Abstract
An electronic image analyzer which is adapted to inspect a given transparent object or a succession of similar objects by producing an illuminated image of the object on a photoelectronic sensor which is then electronically scanned for the purpose of inspecting the image within an electronic look window having the shape of a standard object contour, the shape having been previously stored electronically and capable of being called out through suitable circuits so as to be superimposed on the image. Further, arbitrarily shaped masks may be generated separately or in combination and superimposed on portions of the image within said electronic look window so as to obscure areas which interfere with the inspection process of other areas. Further, the analyzer may be adapted to compare the physical characteristics of a succession of dissimilar objects by superimposing the electronic look window on the images of the objects and rejecting those objects whose shapes or sizes do not conform with the stored standard contour information.