Jack R Obst

Title: Jack R Obst: Innovator in Electronic Image Analysis

Introduction

Jack R Obst is a notable inventor based in Florissant, MO (US). He has made significant contributions to the field of electronic image analysis, particularly through his innovative patent. His work has implications for various industries that rely on precise object inspection and analysis.

Latest Patents

Jack R Obst holds a patent for an "Electronic image analyzing method and apparatus." This invention involves an electronic image analyzer designed to inspect transparent objects by producing illuminated images on a photoelectronic sensor. The sensor is electronically scanned to inspect the image within an electronic look window, which has the shape of a standard object contour. This contour is stored electronically and can be called out through suitable circuits to be superimposed on the image. The analyzer can also generate arbitrarily shaped masks to obscure areas that interfere with the inspection process. Additionally, it can compare the physical characteristics of dissimilar objects by superimposing the electronic look window on their images, rejecting those that do not conform to the stored standard contour information.

Career Highlights

Jack R Obst is associated with Barry-Wehmiller Company, where he applies his expertise in electronic image analysis. His innovative approach has contributed to advancements in the inspection processes used in various applications.

Collaborations

Jack has collaborated with notable coworkers, including Siamac Faani and Ralph M Chambers, Jr. Their combined efforts have further enhanced the development and application of electronic image analysis technologies.

Conclusion

Jack R Obst's contributions to electronic image analysis demonstrate his innovative spirit and commitment to advancing technology in this field. His patent reflects a significant step forward in the inspection of transparent objects, showcasing the importance of precision in various industries.