Hanau, Germany

Ralf Huck

This inventor holds 3 USPTO granted patents. Top assignees: Degussa Gmbh, Mannesmann Aktiengesellschaft, Sensycon. Active years: 1992-1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ralf Huck. Retrieved from https://idiyas.com/inventor/ralf-huck-z9qtuwun

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.5

ph-index = 3

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 1992-1996

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3 patents (USPTO):Explore Patents

Title: Ralf Huck: Innovator in Thin-Film Measurement Technology

Introduction

Ralf Huck is a notable inventor based in Hanau, Germany. He has made significant contributions to the field of measurement technology, particularly through his innovative patents. With a total of 3 patents, Huck has demonstrated his expertise and commitment to advancing technology.

Latest Patents

One of Ralf Huck's latest patents is for a thin-film measurement resistor and the process for producing it. This invention involves using an electrically insulating work material with a low specific heat capacity as the substrate. A metal film, preferably platinum, is applied to this substrate. The lateral electrical resistor is then structured and trimmed through erosive after-treatment, with the metal film being passivated in a final step. This design allows the resistor element to react more quickly to temperature changes, while the cover layer is highly resistant to corrosion. The construction is simplified by using glass as the substrate material, which is treated with a bonding agent layer of Al₂O₃ before the metal film is applied and structured by sputter etching. Finally, a protective coat of SiOₓ is added to the metal film.

Another significant patent is for a direct-intake air measuring apparatus. This invention features an anemometer with a substrate onto which a temperature-dependent surface resistor is deposited. The active surface of the surface resistor is strategically spaced from the leading edge of the substrate. A covering layer extends over the surface resistor and reaches the substrate at least in the area of the active surface, enhancing the device's functionality.

Career Highlights

Throughout his career, Ralf Huck has worked with prominent companies such as Mannesmann Aktiengesellschaft and Degussa GmbH. His experience in these organizations has contributed to his development as an inventor and innovator in measurement technology.

Collaborations

Ralf Huck has collaborated with notable individuals in his field, including Eckert and Wolfgang Muller. These collaborations have likely enriched his work and led to further advancements in his inventions.

Conclusion

Ralf Huck is a distinguished inventor whose work in thin-film measurement technology has led to innovative patents that enhance measurement accuracy and efficiency. His contributions to the field are significant and continue to influence the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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