Munich, Germany

Rainer Kiesel

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Microvision, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rainer Kiesel. Retrieved from https://idiyas.com/inventor/rainer-kiesel-ntzwh5dm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Rainer Kiesel: Innovator in LIDAR Technology

Introduction

Rainer Kiesel is a notable inventor based in Munich, Germany. He has made significant contributions to the field of sensor technology, particularly in LIDAR systems. His innovative approach has led to advancements that enhance measurement accuracy and efficiency.

Latest Patents

Rainer Kiesel holds a patent for a "Method for controlling sensor elements of a LIDAR measuring system." This method involves activating and deactivating sensor elements during measurement cycles. The process includes multiple measurement cycles, where a sensor element is activated at specific times to ensure precise data collection.

Career Highlights

Kiesel is currently employed at Microvision, Inc., where he continues to develop cutting-edge technologies. His work focuses on improving LIDAR systems, which are essential for various applications, including autonomous vehicles and environmental monitoring.

Collaborations

Rainer Kiesel collaborates with Ralf Beuschel, a fellow innovator in the field. Together, they work on projects that push the boundaries of sensor technology and its applications.

Conclusion

Rainer Kiesel's contributions to LIDAR technology exemplify the impact of innovative thinking in engineering. His patent and ongoing work at Microvision, Inc. highlight his commitment to advancing sensor technology for future applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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