The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2024
Filed:
Apr. 03, 2019
Applicant:
Microvision, Inc., Redmond, WA (US);
Inventors:
Ralf Beuschel, Wangen, DE;
Rainer Kiesel, Stetzingen, DE;
Assignee:
Microvision, Inc., Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01S 7/484 (2006.01); G01S 7/4865 (2020.01); G01S 17/18 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4815 (2013.01); G01S 7/484 (2013.01); G01S 7/4865 (2013.01); G01S 17/18 (2020.01);
Abstract
A method for controlling sensor elements of a LIDAR measuring system, wherein a sensor element is activated and deactivated during a measurement cycle, wherein a measurement process comprises a plurality of measurement cycles, wherein the sensor element is activated at a first time during a first measurement cycle and the same sensor element is activated at a second time during a second measurement cycle.