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Karmiel, Israel

Rafi De Picciotto

This inventor holds 5 USPTO granted patents. Top assignee: B-Nano Ltd.. Active years: 2012-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rafi De Picciotto. Retrieved from https://idiyas.com/inventor/rafi-de-picciotto

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 5

% Patents Active = 80.0

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 24(Granted Patents)


Company Filing History:

goldMedal5 out of 6 
 
B-Nano Ltd.
 patents

Years Active: 2012-2016

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5 patents (USPTO):Explore Patents
1. 9466458 - Scanning electron microscope (2016-10-11),
2. 9431213 - Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment (2016-08-30),
3. 8981294 - Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment (2015-03-17),
4. 8492716 - Vacuumed device and a scanning electron microscope (2013-07-23),
5. 8334510 - Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment (2012-12-18),

Title: Rafi De Picciotto: Innovator in Scanning Electron Microscopy

Introduction

Rafi De Picciotto is a prominent inventor based in Carmei Yosef, Israel. He has made significant contributions to the field of scanning electron microscopy, holding a total of 5 patents. His innovative work focuses on developing advanced imaging techniques suitable for non-vacuum environments.

Latest Patents

Among his latest patents is a groundbreaking scanning electron microscope designed for imaging samples in a non-vacuum environment. This invention features an electron source located within an enclosure maintained under vacuum, along with an electron permeable membrane that separates the vacuum environment from the external atmosphere. The membrane is not electrically grounded, and it includes at least one non-grounded electrode that functions as an electron detector.

Another notable patent involves an interface, a scanning electron microscope, and a method for observing objects in a non-vacuum environment. This method generates an electron beam in a vacuum and scans a region of the object while it is positioned below an object holder. The scanning process allows the electron beam to pass through an aperture array and an ultra-thin membrane, which withstands the pressure difference between the two environments. This innovative approach enables the detection of particles generated from the interaction between the electron beam and the object.

Career Highlights

Rafi De Picciotto is currently associated with B-Nano Ltd., where he continues to push the boundaries of electron microscopy technology. His work has garnered attention for its potential applications in various scientific fields.

Collaborations

Rafi collaborates with Dov Shachal, contributing to the advancement of their shared research interests in electron microscopy.

Conclusion

Rafi De Picciotto's contributions to scanning electron microscopy exemplify his innovative spirit and dedication to advancing scientific research. His patents reflect a commitment to developing technologies that enhance imaging capabilities in non-vacuum environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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