The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Feb. 18, 2014
Applicant:
B-nano Ltd., Rehovot, IL;
Inventors:
Dov Shachal, Rehovot, IL;
Rafi De Picciotto, Carmei Yosef, IL;
Assignee:
B-NANO LTD., Rehovot, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/28 (2006.01); H01J 37/18 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01J 37/18 (2013.01); H01J 37/244 (2013.01); H01J 37/28 (2013.01); H01J 2237/164 (2013.01); H01J 2237/188 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/24445 (2013.01); H01J 2237/2605 (2013.01);
Abstract
A scanning electron microscope suitable for imaging samples in a non-vacuum environment, the scanning electron microscope including an electron source located within an enclosure maintained under vacuum, an electron permeable membrane disposed at an opening of the enclosure separating an environment within the enclosure which is maintained under vacuum and an environment outside the enclosure which is not maintained under vacuum, the electron permeable membrane not being electrically grounded and at least one non-grounded electrode operative as an electron detector.