Sunnyvale, CA, United States of America

Rafel C Camarota

This inventor holds 1 USPTO granted patent. Top assignee: Stretch, Inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rafel C Camarota. Retrieved from https://idiyas.com/inventor/rafel-c-camarota

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 2005

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Rafel C Camarota: Innovator in Programmable Logic Arrays

Introduction

Rafel C Camarota is a notable inventor based in Sunnyvale, CA (US). He has made significant contributions to the field of programmable logic arrays, showcasing his expertise through innovative patents.

Latest Patents

Camarota holds a patent for an "Apparatus and method for self-testing programmable logic arrays." This invention features a self-testing programmable logic array (PLA) system that includes an array of programmably interconnected logic cells. The system is equipped with a built-in self-test (BIST) structure that is interconnected with the logic cells. The BIST engine has an initiation input, which, upon receiving the initiation signal, drives the BIST structure to test the connections and functions of the PLA. This technology is applicable for both stand-alone PLAs and those embedded in System-on-a-Chip (SoC) devices.

Career Highlights

Camarota is currently associated with Stretch, Inc., where he continues to develop and refine his innovative ideas in the realm of programmable logic technology. His work has contributed to advancements in self-testing systems, enhancing the reliability and functionality of electronic devices.

Conclusion

Rafel C Camarota's contributions to the field of programmable logic arrays exemplify his innovative spirit and dedication to advancing technology. His patent for self-testing systems marks a significant step forward in ensuring the reliability of electronic components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…