The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2005

Filed:

May. 11, 2000
Applicant:

Rafel C. Camarota, Sunnvale, CA (US);

Inventor:

Rafel C. Camarota, Sunnvale, CA (US);

Assignee:

Stretch, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/28 ; G06F011/00 ;
U.S. Cl.
CPC ...
Abstract

A self-testing programmable logic array PLA system has an array of programmably interconnected logic cells, a built-in self-test (BIST) structure interconnected with the logic cells, and a BIST engine having an initiation input. The system is characterized in that, upon receiving the initiation input, the BIST engine drives the BIST structure to test connections and functions of the PLA. BIST systems are taught for stand-alone programmable logic arrays (PLAs) and for PLAs embedded in System-on-a-Chip (SoC) devices.


Find Patent Forward Citations

Camarota, Rafel. (2005). Apparatus and method for self testing programmable logic arrays (U.S. Patent No. 6874110). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6874110

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…