Radovan Vašina

Title: Radovan Vašina: Innovator in Beam Position Determination

Introduction

Radovan Vašina is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of beam position determination through his innovative methods and systems. His work is particularly relevant in applications that require precise positioning of beamlets.

Latest Patents

Radovan Vašina holds a patent for a "Method and system for determining beam position." This patent describes methods and systems to determine positions of multiple beamlets. The process includes performing a first scan by scanning the beamlets over a first sample region and acquiring multiple cell images. Additionally, a second scan is performed by scanning the beamlets over a second sample region and acquiring multiple cell images. Each cell image corresponds to a beamlet, and at least a part of an overlapped region between the first sample region and the second sample region is scanned by multiple beamlets during both scans. The position of each beamlet may then be determined based on the corresponding cell images acquired during both scans.

Career Highlights

Radovan Vašina is associated with Fei Company, where he applies his expertise in beam position determination. His innovative approach has led to advancements in the field, showcasing his commitment to research and development.

Collaborations

Some of his coworkers include Jan Stopka and Bohuslav Sed'a, who contribute to the collaborative environment at Fei Company.

Conclusion

Radovan Vašina's contributions to beam position determination highlight his innovative spirit and dedication to advancing technology in this field. His patent and work at Fei Company reflect his significant impact on the industry.