Hsinchu, Taiwan

R Y Lee

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: R Y Lee. Retrieved from https://idiyas.com/inventor/r-y-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: R Y Lee - Innovator in Semiconductor Technology

Introduction

R Y Lee is a notable inventor based in Hsin-Chu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of shallow trench isolation.

Latest Patents

R Y Lee holds a patent for a method of forming a shallow trench isolation that features rounded and protected corners. This innovative method involves creating a bird's beak field oxide layer before the trench-forming step. The design ensures that both the top and bottom corners of the trench have a radius of at least 100 angstroms and a trench depth of no more than 5000 angstroms. The rounded top corner is safeguarded by the beak portion of the bird's beak against etching during a subsequent oxide dip process prior to gate formation.

Career Highlights

R Y Lee is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work has contributed to advancements in manufacturing processes that enhance the performance and reliability of semiconductor devices.

Collaborations

R Y Lee has collaborated with esteemed colleagues such as Chue-San Yoo and J H Tsai, further enriching the innovative environment at his workplace.

Conclusion

R Y Lee's contributions to semiconductor technology, particularly through his patented methods, highlight his role as a key innovator in the industry. His work continues to influence advancements in semiconductor manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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