This inventor holds 1 USPTO granted patent. Top assignee: Finisar Corporation. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: R Stephen Speer: Innovator in Wafer-Level Device Testing
Introduction
R Stephen Speer is a notable inventor based in Sachse, TX (US). He has made significant contributions to the field of optoelectronic device testing. His innovative approach focuses on methods and apparatus for device testing at the wafer level.
Latest Patents
R Stephen Speer holds 1 patent for his invention titled "Methods and apparatus for device testing at the wafer level - AC and/or DC testing of an optoelectronic device at the wafer level." This patent outlines a method of testing one or more devices at a wafer level, which includes generating a test signal and supplying it to a single device on a wafer. The method further details how to provide outputs from the single device to multiple devices through a common electrical connection, as well as receiving return currents from each of the return connections.
Career Highlights
R Stephen Speer is currently employed at Finisar Corporation, where he applies his expertise in optoelectronic device testing. His work has been instrumental in advancing the technology used in this field.
Collaborations
Some of his notable coworkers include James Kenneth Guenter and André Lalonde, who have collaborated with him on various projects within the company.
Conclusion
R Stephen Speer is a distinguished inventor whose work in wafer-level device testing has paved the way for advancements in optoelectronic technology. His contributions continue to influence the industry positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile