The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
Jul. 13, 2006
Andre Richard Lalonde, Allen, TX (US);
James Kenneth Guenter, Garland, TX (US);
R. Stephen Speer, Sachse, TX (US);
Andre Richard Lalonde, Allen, TX (US);
James Kenneth Guenter, Garland, TX (US);
R. Stephen Speer, Sachse, TX (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
AC and/or DC testing of an optoelectronic device at the wafer level. In one example embodiment, a method of testing one or more devices at a wafer level includes generating a test signal; supplying the test signal to a single device on a wafer; providing an output of the single device to each of a plurality of devices on the wafer by way of a common electrical connection between the single device and the plurality of devices; providing an output of each of the plurality of devices to a corresponding return connection by way of electrical connections between the plurality of devices and the plurality of return connections; and receiving return currents from each of the return connections.