Qipan Fu

Title: Qipan Fu: FPGA Logic and Boundary-Scan Testing

Introduction

Qipan Fu is an inventor based in Shenzhen, China, whose patent work focuses on programmable logic circuits and FPGA testing. He is associated with Shenzhen Pango Microsystems Co., Ltd. Fu’s listed portfolio includes 2 patents.

Latest Patents

**Programmable Logic Circuit.** This invention describes a programmable logic circuit with lookup-table and selection circuits that generate and route output, carry-propagation, and carry-generation signals. By supporting addition operations involving multivariate functions, the design aims to improve configuration flexibility and the use of logic resources in programmable logic devices.

**Boundary Scan Test Method and Storage Medium.** This method tests the connectivity of a pad directly connected to user logic. It configures an FPGA for test mode, uses user logic to generate a boundary-scan chain, loads test instructions and vectors, and analyzes response data to diagnose faults.

Career Highlights

Fu’s patent work addresses two complementary aspects of programmable logic technology: implementing arithmetic functions efficiently and verifying device connectivity. Together, these areas reflect attention to both circuit configuration and testing.

Collaborations

Fu is associated with Shenzhen Pango Microsystems Co., Ltd. His listed coworkers include Puxia Liu and Shiyjun Zhao.

Conclusion

Qipan Fu’s documented inventions focus on improving programmable logic operations and enabling systematic boundary-scan testing, contributing to the design and verification of FPGA-based systems.