Hsinchu, Taiwan

Qing Dong

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Qing Dong. Retrieved from https://idiyas.com/inventor/qing-dong-bikjlpkt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Qing Dong: Innovator in Multi-Level Cell Sensing Technology

Introduction

Qing Dong is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of multi-level cell (MLC) data storage.

Latest Patents

Qing Dong holds a patent for a "Series of parallel sensing operations for multi-level cells." This invention discloses a circuit and method for reading or sensing multiple bits of data stored by a multi-level cell. The process involves selecting reference circuits from two sets to determine one or more bits of data. Based on these bits, additional reference circuits can be selected to ascertain further bits of data stored in the multi-level cell.

Career Highlights

Qing Dong is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work focuses on enhancing data storage technologies, which are crucial for modern computing applications.

Collaborations

Some of his coworkers include Mahmut Sinangil and Yen-Ting Lin, who contribute to the innovative environment at their workplace.

Conclusion

Qing Dong's work in multi-level cell sensing technology exemplifies the advancements being made in semiconductor research. His contributions are vital for the evolution of data storage solutions in the tech industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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