This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Shenzhen Pango Microsystems Co., Ltd.. Active years: 2024.
Company Filing History:
Years Active: 2024
Title: Puxia Liu: Innovator in Boundary Scan Testing
Introduction
Puxia Liu is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of electronics through his innovative patent. His work focuses on improving testing methods for electronic devices, which is crucial for ensuring their reliability and performance.
Latest Patents
Puxia Liu holds a patent for a "Boundary scan test method and storage medium." This method is designed to test the connectivity of a pad that has a direct connection to user logic. The process involves several steps, including configuring an FPGA to enter a test mode, generating a boundary scan chain, and performing response analysis and fault diagnosis. This innovative approach enhances the efficiency and accuracy of testing electronic components.
Career Highlights
Puxia Liu is associated with Shenzhen Pango Microsystems Co., Ltd., where he applies his expertise in boundary scan testing. His work at the company has positioned him as a key player in advancing testing methodologies in the electronics industry. His dedication to innovation is evident in his patent and the impact it has on the field.
Collaborations
Puxia Liu collaborates with talented individuals such as Shiyjun Zhao and Qipan Fu. Their combined efforts contribute to the development of cutting-edge technologies and solutions in the electronics sector.
Conclusion
Puxia Liu's contributions to boundary scan testing exemplify the importance of innovation in the electronics industry. His patent and collaborative efforts continue to influence the field positively.