Preethi Sama

Title: Preethi Sama: Innovator in Device Testing Technology

Introduction

Preethi Sama is a prominent inventor based in Santa Clara, CA (US). She has made significant contributions to the field of device testing technology, particularly through her innovative patent. Her work is recognized for its impact on integrated circuit testing methodologies.

Latest Patents

Preethi Sama holds a patent for a technology titled "Narrow-parallel scan-based device testing." This invention includes systems and methods for in-system, scan-based device testing using novel narrow-parallel (NarPar) implementations. The patent describes a virtual automated test environment (VATE) system that can be integrated within the operating environment of an integrated circuit. The VATE system is designed to work with a service processor and the chip under test (CuT) via a unique NarPar interface. A sequence controller drives a narrow set of parallel scan pins on the CuT according to an adapted test sequence, which includes bit vector stimulants and expected responses. The responses from the CuT are then compared to the expected results, facilitating effective scan-based testing.

Career Highlights

Preethi Sama is currently employed at Oracle International Corporation, where she continues to develop and refine her innovative technologies. Her work at Oracle has positioned her as a key player in advancing device testing solutions.

Collaborations

Preethi collaborates with talented professionals in her field, including Mark Semmelmeyer and Ali Vahidsafa. These collaborations enhance her work and contribute to the development of cutting-edge technologies.

Conclusion

Preethi Sama is a trailblazer in the realm of device testing technology, with her innovative patent showcasing her expertise and dedication to advancing the field. Her contributions are invaluable to the industry, and her work continues to inspire future innovations.