Austin, TX, United States of America

Pratik Jayant Sanghvi

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Visa International Service Association. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pratik Jayant Sanghvi. Retrieved from https://idiyas.com/inventor/pratik-jayant-sanghvi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Pratik Jayant Sanghvi: Inventor in Mobile Device Authentication

Introduction

Pratik Jayant Sanghvi is an inventor based in Austin, Texas. His patent work includes methods for assessing mobile device application profiles to support device authentication and transaction security.

Latest Patents

Sanghvi is associated with 1 patent: “System, Method, and Computer Program Product for Authenticating a Device Based on an Application Profile.” The invention describes generating a real-time application profile for a mobile device and comparing it with the device’s historical profile to identify anomalies. When an anomaly is detected, the system may take a remedial action related to a transaction. The patent also covers corresponding systems and computer program products.

Career Highlights

Sanghvi is associated with Visa International Service Association. His patent focuses on using mobile application behavior as a factor in device authentication and transaction review.

Collaborations

His listed coworkers include Navendu Misra and Vahini Mohan.

Conclusion

Pratik Jayant Sanghvi’s patent work addresses mobile device authentication by comparing real-time and historical application profiles and enabling remedial action when an anomaly is identified.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…