This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Tektronix, Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Praharsha P Sirsi: Inventor in Networked Device Testing
Introduction
Praharsha P Sirsi is an inventor based in Bengaluru, India. His patent work includes a test and measurement system for capturing and decoding data exchanged by networked devices using an oscilloscope.
Latest Patents
Sirsi is associated with one patent, titled “Method to Capture and Decode Data Transfer Between Networked Devices Using Oscilloscope.” The invention describes a system for testing frequency-hopping communications. A radio-frequency antenna receives signals containing multiple data frames transmitted at different frequencies, while a decoder decodes the frames without needing prior knowledge of the frequencies used. The patent record lists 1 patent.
Career Highlights
Sirsi is associated with Tektronix, Inc., a company known for test and measurement equipment. His patent reflects work on tools for analyzing communications that change frequencies during transmission.
Collaborations
Sirsi’s listed coworker is P E Ramesh. The available information identifies their professional association but does not specify the details of their collaboration.
Conclusion
Praharsha P Sirsi’s patent addresses a practical challenge in testing frequency-hopping communications by enabling data frames to be captured and decoded without advance knowledge of their transmission frequencies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile