Mountain View, CA, United States of America

Prab Varma

This inventor holds 1 USPTO granted patent. Top assignee: Crosscheck Technology, Inc.. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Prab Varma. Retrieved from https://idiyas.com/inventor/prab-varma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Prab Varma: Innovator in Integrated Circuit Testing

Introduction

Prab Varma is a notable inventor based in Mountain View, CA (US). He has made significant contributions to the field of integrated circuits, particularly in the area of delay testing. His innovative approach has led to the development of a unique storage element that enhances the testing process for integrated circuits.

Latest Patents

Prab Varma holds a patent for a "Storage element for delay testing." This invention describes a storage element designed for testing delay paths in integrated circuits. The storage element is utilized in integrated circuits that feature matrices of probe and sense lines. It generates a logic transition on an input to a delay path, closely synchronized with a clock signal. The design includes a data input and a data output connected to the input of the delay path. A master latch receives data from the data input through a first switch, which is controlled by the complement of the clock signal. A slave latch receives data from the master latch through a second switch, controlled by the true of the clock signal. The invention also incorporates sense inputs that load logic states into the master and slave latches, facilitating the generation of desired signal transitions.

Career Highlights

Prab Varma is currently employed at Crosscheck Technology, Inc., where he continues to innovate in the field of integrated circuits. His work has been instrumental in advancing the technology used for delay testing, making it more efficient and reliable.

Collaborations

Throughout his career, Prab has collaborated with talented individuals such as Tushar R Gheewala and Rustam J Mehta. These collaborations have contributed to the development of cutting-edge technologies in the field.

Conclusion

Prab Varma's contributions to integrated circuit testing through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to influence the industry and pave the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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