Taoyuan, Taiwan

Po-Wei Tsou


Average Co-Inventor Count = 1.3

ph-index = 1


Company Filing History:


Years Active: 2018-2023

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2 patents (USPTO):Explore Patents

Title: Po-Wei Tsou: Innovator in Testing Technology

Introduction

Po-Wei Tsou is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of testing technology, holding a total of 2 patents. His work focuses on reducing leakage current in testing systems, showcasing his innovative approach to engineering challenges.

Latest Patents

Tsou's latest patents include a testkey and testing system designed to minimize leakage current. The first patent describes a testkey that incorporates two switching circuits and two compensation circuits. This design allows for efficient testing of multiple devices under test (DUTs) by ensuring that only the DUT being tested receives the test signal, while the other remains in a high impedance state. The compensation circuits play a crucial role in providing current to reduce leakage when one DUT is not being tested.

His second patent involves a test circuit that utilizes a voltage-setting unit to maintain a predetermined voltage at one end of the DUT. This circuit includes pull-up and pull-down devices, a switch circuit, and a voltage-setting unit, all working together to ensure accurate testing conditions.

Career Highlights

Po-Wei Tsou is currently employed at United Microelectronics Corporation, where he continues to develop innovative testing solutions. His expertise in the field has positioned him as a valuable asset to the company and the industry at large.

Collaborations

Tsou collaborates with fellow inventor Chang-Ting Lo, contributing to advancements in testing technology. Their combined efforts enhance the capabilities of testing systems and drive innovation in the field.

Conclusion

Po-Wei Tsou's contributions to testing technology through his patents and work at United Microelectronics Corporation highlight his role as a leading inventor in the industry. His innovative solutions continue to address critical challenges in device testing, making a significant impact on the field.

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