The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2023

Filed:

Aug. 19, 2021
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Po-Wei Tsou, Taoyuan, TW;

Chang-Ting Lo, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/319 (2006.01); G01R 22/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318511 (2013.01); G01R 31/31905 (2013.01);
Abstract

A testkey includes two switching circuits and two compensation circuits. The first switching circuit transmits a test signal to a first DUT when the first DUT is being tested and functions as high impedance when the first DUT is not being tested. The second switching circuit transmits the test signal to a second DUT when the second DUT is being tested and functions as high impedance when the second DUT is not being tested. When the first DUT is not being tested and the second DUT is being tested, the first compensation circuit provides first compensation current for reducing the leakage current of the first switching circuit. When the first DUT is being tested and the second DUT is not being tested, the second compensation circuit provides second compensation current for reducing the leakage current of the second switching circuit.


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