Kaohsiung City, Taiwan

PO-Chi Hu

This inventor holds 1 USPTO granted patent. Top assignee: Metal Industries Research & Development Centre. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: PO-Chi Hu. Retrieved from https://idiyas.com/inventor/po-chi-hu-0iweqgl8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: PO-Chi Hu and Electromagnetic Positioning Calibration

Introduction

PO-Chi Hu is an inventor associated with Kaohsiung City, Taiwan, and the Metal Industries Research & Development Centre. His patent work addresses calibration methods intended to improve the accuracy of electromagnetic positioning systems.

Latest Patents

Hu is associated with 1 patent: “Calibration Method of Magnetic Field Model and Controller for Electromagnetic Positioning.” The invention establishes a magnetic field using a transmitter and collects sensor measurements, including induced-voltage amplitudes at multiple positions. It compares those measurements with simulated data generated by a magnetic field model, then uses nonlinear least-squares objective functions to determine a corrected model. The stated purpose is to improve positioning accuracy.

Career Highlights

The available information connects Hu’s inventive work with the Metal Industries Research & Development Centre. His patent focuses on refining magnetic field models through measured data and mathematical optimization.

Collaborations

The patent information identifies the Metal Industries Research & Development Centre as Hu’s associated organization. No additional collaborators are specified in the provided details.

Conclusion

PO-Chi Hu’s patent applies measurement-based model calibration to electromagnetic positioning, with the goal of improving the system’s accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…