Bengaluru, India

Piyush Kumar Pandey

This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials, Inc.. Active years: 2026.


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Piyush Kumar Pandey: Innovator in Substrate Measurement Technology

Introduction

Piyush Kumar Pandey is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of substrate measurement technology. His innovative approach has led to the development of a patented method that enhances the accuracy of substrate profiles.

Latest Patents

Piyush Kumar Pandey holds a patent for the "Measurement of Inherent Substrate Distortion." This method includes obtaining first data indicative of a measured profile of a substrate. It further involves obtaining second data indicative of a profile of a reference substrate. The process culminates in determining a corrected substrate profile based on the first and second data. Finally, corrective actions are performed based on the corrected substrate profile. This patent showcases his expertise and commitment to advancing technology in his field. He has 1 patent to his name.

Career Highlights

Piyush Kumar Pandey is currently employed at Applied Materials, Inc., a leading company in the semiconductor and display industries. His work at Applied Materials has allowed him to apply his innovative ideas in a practical setting, contributing to the company's success and technological advancements.

Collaborations

Some of his notable coworkers include Prabal Sen and Ganapathy Saravanavel. Their collaboration has fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Piyush Kumar Pandey is a distinguished inventor whose work in substrate measurement technology has made a significant impact. His patented method reflects his dedication to innovation and excellence in his field.

Profile summary based on public USPTO records.
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