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For the Inventor, By the Inventor

Berchem, Belgium

Piet Dewaele

This inventor holds 33 USPTO granted patents and 1 published patent application and 3 EPO patents, primarily in Medical Image Processing. Top assignees: Agfa-Gevaert, Agfa Healthcare Nv, Agfa Healthcare. Active years: 1995-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Piet Dewaele. Retrieved from https://idiyas.com/inventor/piet-dewaele

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 33 

% Patents Active = 54.5

 

Average Co-Inventor Count = 1.4

ph-index = 14

Forward Citations = 644(Granted Patents)


Location History:

  • St. Niklaas, BE (2008)
  • Berchem, BE (1995 - 2011)
  • Sint-Niklass, BE (2011 - 2012)
  • Sint-Niklaas, BE (2011 - 2015)

Company Filing History:

goldMedal14 out of 666 
 
Agfa-Gevaert
 patents
silverMedal10 out of 115 
 
Agfa Healthcare Nv
 patents
bronzeMedal6 out of 41 
 
Agfa Healthcare
 patents
4. 3 out of 1,313 
 
Agfa Gevaert Nv
 patents
5. 2 out of 631 
 
Katholieke Universiteit Leuven
 patents
where one patent can have more than one assignee

Years Active: 1995-2015

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Areas of Expertise:
3D Digital Medical Images
Segmentation
Radiographic Scoring
Geometric Measurements
Noise Reduction
Image Enhancement
Mammograms
Orientation Detection
Radiation Images
Temporal Subtraction
Speech Recognition
33 patents (USPTO):Explore Patents
1. 9129390 - Method of segmenting anatomic entities in 3D digital medical images (2015-09-08),
2. 8503742 - Method for mass candidate detection and segmentation in digital mammograms (2013-08-06),
3. 8290223 - Method for segmenting digital medical image (2012-10-16),
4. 8229190 - Visual enhancement of interval changes using temporal subtraction and pattern detector (2012-07-24),
5. 8229189 - Visual enhancement of interval changes using temporal subtraction, convolving, and non-rigid transformation field mapping (2012-07-24),
6. 8224046 - Visual enhancement of interval changes using rigid and non-rigid transformations (2012-07-17),
7. 8165359 - Method of constructing gray value or geometric models of anatomic entity in medical image (2012-04-24),
8. 8121371 - Method of performing measurements on digital images (2012-02-21),
9. 8121370 - Method of performing measurements on digital images (2012-02-21),
10. 8036492 - Method of detecting the orientation of an object in an image (2011-10-11),
11. 8023708 - Method of segmenting anatomic entities in digital medical images (2011-09-20),
12. 8014625 - Method of performing measurements on digital images (2011-09-06),
13. 7916917 - Method of segmenting anatomic entities in digital medical images (2011-03-29),
14. 7796839 - Method of detecting the orientation of an object in an image (2010-09-14),
15. 7616818 - Method of determining the orientation of an image (2009-11-10),

Title: Piet Dewaele - Innovative Inventor from Berchem, BE

Introduction: Piet Dewaele is a renowned inventor hailing from Berchem, Belgium, known for his groundbreaking contributions to various fields of technology and innovation.

Latest Patents: Piet Dewaele holds several patents in the areas of renewable energy, sustainable agriculture, and advanced materials, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With a career spanning over two decades, Piet Dewaele has worked with leading research institutions and companies to develop cutting-edge solutions that have had a significant impact on the industry.

Collaborations: Throughout his career, Piet Dewaele has collaborated with top universities, innovative startups, and established corporations to bring his ideas to life and create tangible products that address real-world challenges.

Conclusion: Piet Dewaele's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a visionary inventor, inspiring the next generation of innovators to push the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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