The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Oct. 24, 2007
Marek Suliga, Koszalim, PL;
Piet Dewaele, Sint-Niklaas, BE;
Rudi Deklerck, Vilvoorde, BE;
Edgard Nyssen, Brussels, BE;
Gert Behiels, Edegem, BE;
Marek Suliga, Koszalim, PL;
Piet Dewaele, Sint-Niklaas, BE;
Rudi Deklerck, Vilvoorde, BE;
Edgard Nyssen, Brussels, BE;
Gert Behiels, Edegem, BE;
Agfa HealthCare N.V., Mortsel, BE;
Abstract
A Markov Random Field (MRF)-based technique is described for performing clustering of images characterized by poor or limited data. The proposed method is a statistical classification model that labels the image pixels based on the description of their statistical and contextual information. Apart from evaluating the pixel statistics that originate from the definition of the K-means clustering scheme, the model expands the analysis by the description of the spatial dependence between pixels and their labels (context), hence leading to the reduction of the inhomogeneity of the segmentation output with respect to the result of pure K-means clustering.