Paupisi, Italy

Piero Coletta

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Stmicroelectronics International N.v.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Piero Coletta. Retrieved from https://idiyas.com/inventor/piero-coletta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Piero Coletta: Inventor of an Electrochemical Impedance Spectroscopy Measuring Device

Introduction

Piero Coletta is an inventor based in Paupisi, Italy, and is associated with STMicroelectronics International N.V. His patent work includes an invention for measuring battery impedance using electrochemical impedance spectroscopy (EIS).

Latest Patents

Coletta is named on 1 patent: “Electrochemical Impedance Spectroscopy Measuring Device and Method.” The invention describes a device that measures the alternating current between a battery and an electronic circuit, as well as the voltage at the battery’s terminals. In one operating mode, the device draws energy from the battery and stores it in an energy-storage circuit. In another mode, it draws on that stored energy and reinjects it into the battery. These operations support the measurement of the battery’s impedance.

Career Highlights

Coletta’s listed patent reflects work on battery measurement technology and electronic circuits. His association with STMicroelectronics International N.V. places this work within the semiconductor and electronics industry.

Collaborations

The provided information lists Jiri Ryba and Vittorio D’Angelo as Coletta’s coworkers. The patent concerns a device and method for characterizing battery impedance.

Conclusion

Piero Coletta’s patent contribution focuses on an EIS measuring device that manages energy between a battery and a storage circuit to enable impedance measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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