This inventor holds 1 USPTO granted patent. Top assignee: Sandia Corporation. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: The Innovations of Phillip D Walkington
Introduction
Phillip D Walkington is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of ultrasonic inspection technology. His work focuses on developing methods and apparatuses that enhance the detection of structural failures.
Latest Patents
Walkington holds a patent for an "Ultrasonic inspection apparatus and method using a focused wave device." This innovative apparatus utilizes an ultrasonic pulse echo inspection method to detect structural failures. A focus lens is coupled to the transducer, allowing the ultrasonic signal to be concentrated on the area under inspection. Additionally, a stop is placed in the focus lens to block selected ultrasonic waves, while allowing other waves to pass through the structure. This design results in an echo response with significantly less distortion, improving the accuracy of inspections.
Career Highlights
Phillip D Walkington is associated with Sandia Corporation, where he applies his expertise in ultrasonic technology. His work at Sandia has positioned him as a key player in advancing inspection methodologies. With a patent portfolio that includes 1 patent, Walkington continues to contribute to the field through innovative solutions.
Collaborations
Walkington has collaborated with notable colleagues, including John H Gieske and Dennis P Roach. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.
Conclusion
Phillip D Walkington's contributions to ultrasonic inspection technology exemplify the impact of innovation in detecting structural failures. His patented methods and collaborative efforts continue to shape the future of inspection technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
