The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2001
Filed:
Mar. 29, 1999
Applicant:
Inventors:
John H. Gieske, Albuquerque, NM (US);
Dennis P. Roach, Albuquerque, NM (US);
Phillip D. Walkington, Albuquerque, NM (US);
Assignee:
Sandia Corporation, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/910 ;
U.S. Cl.
CPC ...
G01N 2/910 ;
Abstract
An ultrasonic pulse echo inspection apparatus and method for detecting structural failures. A focus lens is coupled to the transducer to focus the ultrasonic signal on an area to be inspected and a stop is placed in the focus lens to block selected ultrasonic waves. Other waves are not blocked and are transmitted through the structure to arrive at interfaces therein concurrently to produce an echo response with significantly less distortion.