Hillsborough, NC, United States of America

Philip Nelson Elcan

This inventor holds 1 USPTO granted patent. Top assignee: Nvidia Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Philip Nelson Elcan. Retrieved from https://idiyas.com/inventor/philip-nelson-elcan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Philip Nelson Elcan: Computing-System Fault Detection

Introduction

Philip Nelson Elcan is an inventor associated with Hillsborough, North Carolina, and Nvidia Corporation. His patent work addresses fault detection and testing in computing systems. The supplied information lists 1 patent.

Latest Patents

Elcan’s listed patent, “Fault detection,” describes techniques for testing processing units in a computing system. The approach receives a request to test a set of processing units and transfers operations between virtual processors so that a unit can be tested while the other processor continues executing those operations. After testing is complete, execution is transferred back, and the process can be initiated for another processing unit. This method is designed to support testing while system operations continue.

Career Highlights

The provided information associates Elcan with Nvidia Corporation and identifies his patent contribution in computing-system testing. The patent focuses on coordinating processor workloads and testing to detect faults.

Collaborations

Jason Sequeira and Daniel Jonathan Hettena are listed as Elcan’s coworkers. The supplied details do not specify their roles in the patent or the invention.

Conclusion

Philip Nelson Elcan’s listed invention concerns a method for testing computing-system processing units while maintaining the execution of operations, reflecting a focus on fault detection and processor reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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