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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12761942 B1

PDFFull Text
Date of Patent:
Oct. 13, 2026

Filed:

Oct. 20, 2023

Fault detection

Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Philip Nelson Elcan, Hillsborough, NC (US);

Jason Sequeira, Fremont, CA (US);

Daniel Jonathan Hettena, Princeton, NJ (US);

William Joseph Armstrong, Rochester, MN (US);

Aingarathasan Paramakuru, Pickering, CA;

Thomas Fleury, Chapel Hill, NC (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:

Lowenstein Sandler LLP

Primary Examiner:

Kaushikkumar M Patel

Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 9/45558 (2013.01); G06F 11/2236 (2013.01); G06F 11/2273 (2013.01); G06F 2009/4557 (2013.01); G06F 2009/45591 (2013.01);
Abstract

Apparatuses, systems, and techniques for testing processing units of a computing system are disclosed herein. A request to initiate a testing process for each of a set of processing units is received. A first processing unit includes a first virtual processor executing first operations. A second processing unit includes a second virtual processor executing second operations. Execution of the first operations is transferred from the first virtual processor to the second virtual processor. Execution of the testing process is initiated at the first processing unit while the second virtual processor executes the first and second operations. In response to a detection that the execution of the testing process is completed, execution of the first and second operations is transferred to the first virtual processor. Execution of the testing process is initiated at the second processing unit while the first virtual processor running executes the first and second operations.

Find Patent Forward Citations

Elcan, Philip. (2026). Fault detection (U.S. Patent No. 12761942). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761942

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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