Newbury, United Kingdom

Philip M Daniell


Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 13(Granted Patents)


Location History:

  • Kingsclere, GB (2000)
  • Newbury, GB (2006)

Company Filing History:


Years Active: 2000-2006

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2 patents (USPTO):Explore Patents

Title: The Innovations of Philip M Daniell

Introduction

Philip M Daniell is a notable inventor based in Newbury, GB. He has made significant contributions to the field of electrical engineering, particularly in high voltage switching technologies. With a total of 2 patents to his name, Daniell continues to push the boundaries of innovation in his field.

Latest Patents

Daniell's latest patents include a high voltage switch designed to eliminate latch-up hazards. This invention discloses a method and system for generating and delivering a high voltage signal without incurring a voltage drop due to the threshold of the switching element. By utilizing NMOS elements, the invention effectively removes latch-up hazards, allowing for efficient switching of high voltage signals. Additionally, he has developed a voltage threshold detection circuit that enhances the performance of output buffers. This circuit automatically adjusts the output impedance of the buffer based on the voltage level, ensuring reliable and consistent operation.

Career Highlights

Philip M Daniell is currently employed at Cypress Semiconductor Corporation, where he applies his expertise in developing advanced semiconductor technologies. His work has significantly impacted the efficiency and reliability of high voltage systems.

Collaborations

Daniell collaborates with Grahame K Reynolds, contributing to innovative projects that enhance the capabilities of their technologies.

Conclusion

Philip M Daniell's contributions to high voltage switching and output buffer technologies demonstrate his commitment to innovation in electrical engineering. His patents reflect a deep understanding of the challenges in the field and provide solutions that enhance performance and reliability.

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