This inventor holds 1 USPTO granted patent. Top assignee: Fei Comapny. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Petra Binknerová and Microscopy Sample Preparation
Introduction
Petra Binknerová is an inventor associated with Radešínská Svratka, Czech Republic, and work at FEI Company. Her patent concerns methods and systems for preparing samples for microscopy.
Latest Patents
Binknerová is associated with 1 patent, titled “Microscopy Sample Preparation Methods and Associated Systems.” The disclosed methods include evaluating projected sample-characterization values across processing axes to select a preferred axis. Other examples describe extracting and imaging a specimen, determining a preferred tilt angle, rotating the specimen, and processing it into a lamella. A related system uses a focused ion beam, sample holder, stage, and controller to position the specimen so the beam approaches along the preferred processing axis.
Career Highlights
The patent reflects work on sample preparation techniques intended to guide specimen orientation and processing for microscopy. The supplied information associates Binknerová with FEI Company.
Collaborations
The supplied information names Dennis Vymer and David Prentice as coworkers.
Conclusion
Petra Binknerová’s patent addresses microscopy sample preparation through methods and systems for selecting processing orientations and producing lamellae.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile