Petr Sytar

Title: Innovations of Petr Sytar in Particle-Optical Technology

Introduction

Petr Sytar is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of particle-optical technology, holding three patents that showcase his innovative approach to enhancing electron microscopy.

Latest Patents

One of his latest patents is a method of using a compound particle-optical lens. This invention relates to a compound objective lens for a Scanning Electron Microscope (SEM) that incorporates a conventional magnetic lens, an immersion magnetic lens, and an immersion electrostatic lens. The design allows for the electron beam to be focused on the sample through various combinations of lens coil excitations. This innovation improves the detection of back-scattered electrons (BSEs) by enabling the adjustment of their impact distance on the detector, thus functioning as an energy-selective detector.

Another significant patent is the in-column detector for a particle-optical column. This invention features an in-column back-scattered electron detector integrated within a combined electrostatic/magnetic objective lens for SEM. The detector utilizes a charged particle-sensitive surface, such as a scintillator disk, which serves as one of the electrode faces in the electrostatic focusing field. The photons generated in the scintillator are detected by a photon detector, enhancing the capabilities of the SEM.

Career Highlights

Petr Sytar is currently employed at FEI Company, where he continues to develop innovative solutions in the field of electron microscopy. His work has significantly advanced the understanding and application of particle-optical technologies.

Collaborations

Throughout his career, Sytar has collaborated with notable colleagues, including Petr Hlavenka and Lubomír Tůma. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Petr Sytar's contributions to particle-optical technology through his patents and collaborations highlight his role as an influential inventor in the field. His work continues to impact the advancements in electron microscopy and related technologies.