Singapore, Singapore

Peter Zhihua Yuan

This inventor holds 1 USPTO granted patent. Top assignee: Motorola Corporation. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Zhihua Yuan. Retrieved from https://idiyas.com/inventor/peter-zhihua-yuan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Peter Zhihua Yuan and Semiconductor Package Underfilling

Introduction

Peter Zhihua Yuan is an inventor associated with Singapore. His patent work concerns a method and machine for underfilling an assembly to form a semiconductor package.

Latest Patents

The provided information lists 1 patent for Yuan: “Method and Machine for Underfilling an Assembly to Form a Semiconductor Package.” The invention describes conveying an assembly on tracks through preheating, dispensing, and postheating zones. The assembly includes a flexible tape substrate and an inverted semiconductor die. In the dispensing zone, underfill material is applied to the heated substrate so it can flow into the gap between the substrate and die. Postheating supports continued flow of the material into that gap.

Career Highlights

Yuan is associated with Motorola Corporation. His listed patent focuses on a continuous process for applying underfill material during semiconductor package assembly.

Collaborations

The provided information names James Boon Hua How and Han Yang Chua as Yuan’s coworkers. Their names are associated with his professional context, though specific collaborative roles are not provided.

Conclusion

Peter Zhihua Yuan’s listed invention addresses semiconductor packaging through a machine-based process designed to promote consistent underfill flow beneath an inverted die.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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