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For the Inventor, By the Inventor

Benton Harbor, MI, United States of America

Peter Markel Willis

This inventor holds 28 USPTO granted patents and 3 published patent applications, primarily in Analytical Instrumentation. Top assignees: Leco Corporation, Other. Active years: 1993-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Markel Willis. Retrieved from https://idiyas.com/inventor/peter-markel-willis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 28 

% Patents Active = 96.4

Average Co-Inventor Count = 2.0

ph-index = 11

Forward Citations = 264(Granted Patents)


Company Filing History:

goldMedal27 out of 195 
 
Leco Corporation
 patents
silverMedal1 out of 834,570 
Other
 patents

Years Active: 1993-2024

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Areas of Expertise:
Chromatographic Peaks
Data Acquisition System
Spectrometer
Temperature Control
Analytical Furnace
Nitrogen Determination
Rotary Dosing Device
Thermal Conductivity Cell
Isothermal Calorimeter
Wind-Powered Vehicle
Bidirectional Ballast
Molar Transfer Device
28 patents (USPTO):Explore Patents
1. 12100584 - Methods and systems for multi-pass encoded frequency pushing (2024-09-24),
2. 11899032 - Molar transfer device (2024-02-13),
3. 11726010 - Rotary dosing device (2023-08-15),
4. 10636637 - Systems and methods to process and group chromatographic peaks (2020-04-28),
5. 10488377 - Systems and methods to process data in chromatographic systems (2019-11-26),
6. 9786484 - Method and apparatus for decoding multiplexed information in a chromatographic system (2017-10-10),
7. 9435758 - Bidirectional ballast (2016-09-06),
8. 9243954 - Circuit and method for controlling an IR source for an analytical instrument (2016-01-26),
9. 9184035 - Data acquisition system for a spectrometer using an ion statistics filter and/or a peak histogram filtering circuit (2015-11-10),
10. 9153424 - Correcting time-of-flight drifts in time-of-flight mass spectrometers (2015-10-06),
11. 9082597 - Data acquisition system for a spectrometer using an ion statistics filter and/or a peak histogram filtering circuit (2015-07-14),
12. 8063360 - Data acquisition system for a spectrometer using various filters (2011-11-22),
13. 8017907 - Data acquisition system for a spectrometer that generates stick spectra (2011-09-13),
14. 7884319 - Data acquisition system for a spectrometer (2011-02-08),
15. 7825373 - Data acquisition system for a spectrometer using horizontal accumulation (2010-11-02),

Title: The Inventor Profile of Peter Markel Willis

Introduction: Peter Markel Willis is a distinguished inventor based in Benton Harbor, Michigan. His innovative spirit and dedication to creating groundbreaking solutions have made him a notable figure in the world of patents and inventions.

Latest Patents: Peter Markel Willis holds several patents in various fields, including technology, engineering, and consumer products. His recent patents showcase his ability to think outside the box and develop unique solutions to everyday problems.

Career Highlights: With a career spanning over two decades, Peter Markel Willis has established himself as a prolific inventor with a keen eye for detail. His contributions to the field have earned him recognition from peers and industry experts alike.

Collaborations: Throughout his career, Peter Markel Willis has collaborated with leading companies, research institutions, and universities to bring his inventions to life. His ability to work effectively in multidisciplinary teams has led to the successful development of cutting-edge technologies.

Conclusion: In conclusion, Peter Markel Willis is a visionary inventor whose passion for innovation continues to drive him towards creating a better future. His dedication to pushing the boundaries of what is possible serves as an inspiration to aspiring inventors around the world.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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