The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 2015

Filed:

Jun. 10, 2015
Applicant:

Leco Corporation, St. Joseph, MI (US);

Inventors:

Peter Markel Willis, Benton Harbor, MI (US);

Michael C. Mason, St. Joseph, MI (US);

Mark R. Wheeler, Saint Joseph, MI (US);

Viatcheslav Artaev, St. Joseph, MI (US);

Julie R. Pitz, Buchanan, MI (US);

Assignee:

LECO Corporation, St. Joseph, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); H01J 49/40 (2013.01);
Abstract

A data acquisition system and method are described that may be used with various spectrometers. The data acquisition system may include an ion detector, an initial processing module, and a spectra processing module. The initial processing module is provided for processing the ion detection signals and for supplying processed signals to the spectra processing module. The spectra processing module generates spectra from the processed signals and supplies the generated spectra to an external processor for post-processing. The spectra processing module may include an ion statistics filter and/or a peak histogram filtering circuit.


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