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For the Inventor, By the Inventor

Beaverton, OR, United States of America

Peter J Letts

This inventor holds 9 USPTO granted patents and 2 published patent applications. Top assignee: Tektronix, Inc.. Active years: 2001-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter J Letts. Retrieved from https://idiyas.com/inventor/peter-j-letts

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 9 

% Patents Active = 44.4

Average Co-Inventor Count = 1.2

ph-index = 4

Forward Citations = 43(Granted Patents)


Company Filing History:

goldMedal9 out of 2,760 
 
Tektronix, Inc.
 patents

Years Active: 2001-2017

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9 patents (USPTO):Explore Patents
1. 9541579 - Methods and systems for generating displays of waveforms (2017-01-10),
2. 7359810 - Characterizing newly acquired waveforms for identification of waveform anomalies (2008-04-15),
3. 7320014 - Method and apparatus for identifying similar events in long data records (2008-01-15),
4. 6980212 - Method and apparatus for computing thresholds for identification of waveform anomalies (2005-12-27),
5. 6928374 - Methods for displaying jitter and other anomalies in long acquisition data records (2005-08-09),
6. 6778931 - Test and measurement instrument having multi-channel telecommunications mask testing capability (2004-08-17),
7. 6728648 - Test and measurement instrument having telecommunications mask testing capability with an autofit to mask feature (2004-04-27),
8. 6642926 - Test and measurement instrument having telecommunications mask testing capability with a mask zoom feature (2003-11-04),
9. 6297796 - Ink saver apparatus and method for use in a test and measurement instrument (2001-10-02),

Title: The Innovative Contributions of Peter J. Letts

Introduction

Peter J. Letts is a notable inventor based in Beaverton, OR (US). He has made significant contributions to the field of waveform analysis, holding a total of 9 patents. His work focuses on methods and systems that enhance the detection and characterization of anomalies in non-repetitive signals.

Latest Patents

Among his latest patents are innovative methods for generating displays of waveforms. One such method describes devices capable of visually detecting anomalies in non-repetitive signals. This includes an oscilloscope that can display segments of a complete waveform record, which features non-periodic triggering events. The segments are displayed both vertically and horizontally offset from one another, aiding in the visual detection of anomalies within the record. Additionally, decayed or aged segments of a waveform can be displayed simultaneously. Another patent involves characterizing newly acquired waveforms in relation to previously acquired ones during the monitoring of generally repetitive signals. This method utilizes a two-dimensional array of memory locations to read history values, compare them with ranges, and determine the variability of the newly acquired waveform.

Career Highlights

Peter J. Letts is currently employed at Tektronix, Inc., where he continues to innovate in the field of waveform analysis. His work has significantly impacted the way engineers and scientists analyze signals, making it easier to identify anomalies that could affect performance.

Collaborations

Throughout his career, Letts has collaborated with notable colleagues such as Steven C. Herring and David P. Maguire. These collaborations have further enriched his work and contributed to the advancements in waveform analysis technologies.

Conclusion

Peter J. Letts exemplifies the spirit of innovation in the field of waveform analysis. His contributions through patents and collaborations have paved the way for advancements that enhance the detection of signal anomalies. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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