Idaho Falls, ID, United States of America

Peter G Shaw

This inventor holds 1 USPTO granted patent. Top assignee: Battelle Energy Alliance, LLC. Active years: 2006.


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations of Peter G Shaw in Electrochemical Impedance Spectroscopy

Introduction

Peter G Shaw is an accomplished inventor based in Idaho Falls, ID (US). He has made significant contributions to the field of electrochemical impedance spectroscopy, particularly in methods for determining spatial locations of defects in materials. His innovative approach has the potential to enhance material analysis and defect detection.

Latest Patents

Peter G Shaw holds a patent for an "Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects." This patent describes a method and apparatus that includes providing a plurality of electrodes in contact with a material. The process involves applying a sinusoidal voltage to selected electrodes at a predetermined frequency. It also includes determining gain and phase angle measurements at other electrodes in response to the applied voltage, computing an impedance spectrum for an area of the material, and comparing it with a known impedance spectrum to identify spatial locations of defects.

Career Highlights

Peter G Shaw is associated with Battelle Energy Alliance, LLC, where he applies his expertise in electrochemical systems. His work has contributed to advancements in material science and engineering, particularly in defect detection methodologies.

Collaborations

Peter has collaborated with notable colleagues, including David F Glenn and Gretchen E Matthern. Their combined efforts have furthered research and development in their respective fields.

Conclusion

Peter G Shaw's innovative work in electrochemical impedance spectroscopy exemplifies the impact of dedicated inventors in advancing technology. His contributions are vital for improving material analysis and defect detection processes.

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