The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2006
Filed:
Dec. 16, 2004
David F. Glenn, Idaho Falls, ID (US);
Gretchen E. Matthern, Idaho Falls, ID (US);
W. Alan Propp, Idaho Falls, ID (US);
Anne W. Glenn, Idaho Falls, ID (US);
Peter G. Shaw, Idaho Falls, ID (US);
David F. Glenn, Idaho Falls, ID (US);
Gretchen E. Matthern, Idaho Falls, ID (US);
W. Alan Propp, Idaho Falls, ID (US);
Anne W. Glenn, Idaho Falls, ID (US);
Peter G. Shaw, Idaho Falls, ID (US);
Battelle Energy Alliance, LLC, Idaho Falls, ID (US);
Abstract
A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.