Location History:
- Dublin, IE (2000 - 2006)
- County Dublin, IE (2007)
Company Filing History:
Years Active: 2000-2007
Title: The Innovative Contributions of Peter Conlon
Introduction
Peter Conlon is a notable inventor based in Dublin, Ireland. He has made significant contributions to the field of machine vision technology, holding a total of 7 patents. His work focuses on enhancing the capabilities of machine vision systems, particularly in measuring heights of items with precision.
Latest Patents
Among his latest patents is a machine vision system designed for measuring heights of items. This innovative system utilizes two laser sources to illuminate a solder deposit from both sides, ensuring comprehensive coverage without occlusion. The camera in this system is equipped with an FGPA programmed to define a subset of the sensor array as a region of interest for processing with each laser source. This design effectively reduces the amount of data transfer and processing required. Another notable patent involves an illumination head for machine vision, which features an annular support with multiple illumination sections. The third section includes three sets of LEDs arranged to illuminate at approximately the same angle, capturing a series of monochrome images that are superimposed to create a color image, enhancing the information obtained from the high-resolution monochrome camera.
Career Highlights
Peter Conlon has worked with several companies throughout his career, including Mv Research Limited and Xsil Technology Limited. His experience in these organizations has contributed to his expertise in machine vision technology and innovation.
Collaborations
Peter has collaborated with notable individuals in his field, including James Mahon and Adrian Boyle. These collaborations have likely fostered an environment of creativity and innovation, further enhancing his contributions to technology.
Conclusion
Peter Conlon's work in machine vision technology exemplifies the spirit of innovation and dedication to advancing the field. His patents reflect a commitment to improving measurement systems and enhancing image processing capabilities.