The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2003

Filed:

Dec. 23, 1999
Applicant:
Inventors:

James Mahon, Dublin, IE;

Adrian Boyle, Kildare, IE;

Niall Dorr, Dublin, IE;

Peter Conlon, Dublin, IE;

Assignee:

M.V. Research Limited, Dublin, IE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A measurement system ( ) has a camera with a lens ( ) and a separate sensor ( ) mounted so that their planes ( ) intersect at an object plane ( ) according to the Scheimpflug principle. A reference camera( ) is normal and provides a 2D normal image which is used by an image processor ( ) to determine a calibration image. This allows the image processor to determine height of the object ( ). A single image capture provides an image of the full object, such as a ball grid array (BGA).


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