Ottawa, Canada

Peter Campbell

This inventor holds 2 USPTO granted patents, plus 1 CIPO patent. Top assignees: Mentor Graphics Corporation, Valydate, Inc.. Active years: 2014-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Peter Campbell. Retrieved from https://idiyas.com/inventor/peter-campbell-0a0r65tg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2014-2019

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2 patents (USPTO):Explore Patents

Title: Innovations by Peter Campbell

Introduction

Peter Campbell is a notable inventor based in Ottawa, Canada. He has made significant contributions to the field of circuit design, holding a total of 2 patents. His work focuses on systems and methods for validating circuit designs, showcasing his expertise in this technical area.

Latest Patents

Peter's latest patents include innovative methods for validating circuit definitions. These systems involve determining a subset of checks to apply to a portion of the overall circuit based on the pin type composition of that circuit portion. This approach enhances the reliability and efficiency of circuit validation processes.

Career Highlights

Throughout his career, Peter has worked with prominent companies such as Valydate, Inc. and Mentor Graphics Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in circuit design technology.

Collaborations

Peter has collaborated with talented individuals in his field, including Michael Alam and Mark Cianfaglione. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Peter Campbell's contributions to circuit design and validation are noteworthy, and his patents reflect his commitment to innovation in this field. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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