This inventor holds 1 USPTO granted patent. Top assignee: U.S. Philips Corporation. Active years: 1995.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1995
Title: Peter C. Walters and Hyper-Frequency Calibration
Introduction
Peter C. Walters is an inventor associated with Bowen Island, Canada. His recorded patent concerns calibration for measuring the dispersion parameters of integrated-circuit elements on a substrate. Walters is listed as having 1 patent and as having worked with U.S. Philips Corporation.
Latest Patents
Walters’s patent, “Calibration Device for Hyper-Frequency Adjustment of the Reference,” describes a device for adjusting the reference planes of measurement equipment used to characterize circuit elements integrated on a substrate.
The device places standard patterns and compatible probe accesses on the same substrate. It includes at least two identical series of parallel-line patterns, such as short-circuit, open, or load lines. The patterns’ arrangement aligns their accesses within each series while positioning the series in opposing orientations. Their ends define facing reference planes separated by a specified distance, with offset ends arranged to accommodate the substrate’s thickness. This configuration is intended to support calibration of the measurement apparatus.
Career Highlights
A key documented highlight of Walters’s inventive work is this calibration approach, which addresses the practical challenge of establishing reference planes for high-frequency measurements on integrated circuits. His patent record also connects him professionally with U.S. Philips Corporation.
Collaborations
Walters’s listed coworker is Patrice Gamand. The available information identifies this professional association but does not specify the coworker’s role in the patent.
Conclusion
Peter C. Walters’s patent presents a substrate-based calibration device designed to improve reference-plane adjustment in high-frequency measurements of integrated-circuit elements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
